Degradation of magnetic tunnel junctions with thin AlOx barrier
The degradation of magnetic tunnel junctions (MTJs) with AlOx barrier was experimentally investigated. Constant voltage stress (CVS) measurement was carried out to monitor the time evolution of the conductance and tunneling magnetoresistance (TMR) of MTJs. The gradual increase of the stress-induced...
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| Format: | Article |
| Language: | English |
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Taylor & Francis Group
2007-01-01
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| Series: | Science and Technology of Advanced Materials |
| Online Access: | http://www.iop.org/EJ/abstract/1468-6996/8/3/A21 |