Determination of the Projected Atomic Potential by Deconvolution of the Auto-Correlation Function of TEM Electron Nano-Diffraction Patterns

Determination of the Projected Atomic Potential by Deconvolution of the Auto-Correlation Function of TEM Electron Nano-Diffraction Patterns

We present a novel method to determine the projected atomic potential of a specimen directly from transmission electron microscopy coherent electron nano-diffraction patterns, overcoming common limitations encountered so far due to the dynamical nature of electron-matter interaction. The projected p...

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Bibliographic Details
Main Authors: Liberato De Caro, Francesco Scattarella, Elvio Carlino
Format: Article
Language:English
Published: MDPI AG 2016-11-01
Series:Crystals
Subjects:
transmission electron microscopy
coherent diffraction imaging
electron crystallography
atomic potential
Online Access:http://www.mdpi.com/2073-4352/6/11/141

Internet

http://www.mdpi.com/2073-4352/6/11/141

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