Evolution of MBE HgCdTe defect structure studied with ion milling method
In this paper, is shown how ion milling can assist in assessing the defect structure of MCT by revealing the residual doping, and establishing the minimum level of donor concentration Nmd, which is needed for obtaining n-regions with a reproducible n value. For this purpose, a study of the electrica...
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Format: | Article |
Language: | English |
Published: |
EDP Sciences
2017-01-01
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Series: | EPJ Web of Conferences |
Online Access: | http://dx.doi.org/10.1051/epjconf/201713301004 |