Long-Read–Based de novo Genome Assembly and Comparative Genomics of the Wheat Leaf Rust Pathogen Puccinia triticina Identifies Candidates for Three Avirulence Genes

Long-Read–Based de novo Genome Assembly and Comparative Genomics of the Wheat Leaf Rust Pathogen Puccinia triticina Identifies Candidates for Three Avirulence Genes

Leaf rust, caused by Puccinia triticina (Pt), is one of the most devastating diseases of wheat, affecting production in nearly all wheat-growing regions worldwide. Despite its economic importance, genomic resources for Pt are very limited. In the present study, we have used long-read sequencing (LRS...

Full description

Bibliographic Details
Main Authors: Jing Qin Wu, Chongmei Dong, Long Song, Robert F. Park
Format: Article
Language:English
Published: Frontiers Media S.A. 2020-06-01
Series:Frontiers in Genetics
Subjects:
wheat leaf rust
avirulence genes
secreted protein
long-read assembly
comparative genomics
Online Access:https://www.frontiersin.org/article/10.3389/fgene.2020.00521/full

Internet

https://www.frontiersin.org/article/10.3389/fgene.2020.00521/full

Similar Items