Estimating Regions of Deterioration in Electron Microscope Images of Rubber Materials via a Transfer Learning-Based Anomaly Detection Model

Estimating Regions of Deterioration in Electron Microscope Images of Rubber Materials via a Transfer Learning-Based Anomaly Detection Model

A method for estimating regions of deterioration in electron microscope images of rubber materials is presented in this paper. Deterioration of rubber materials is caused by molecular cleavage, external force, and heat. An understanding of these characteristics is essential in the field of material...

Full description

Bibliographic Details
Main Authors: Ren Togo, Naoki Saito, Takahiro Ogawa, Miki Haseyama
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Materials informatics
anomaly detection
deep learning
transfer learning
Online Access:https://ieeexplore.ieee.org/document/8889738/

Internet

https://ieeexplore.ieee.org/document/8889738/

Similar Items