Theoretical Study on Synchronous Characterization of Surface and Interfacial Mechanical Properties of Thin-Film/Substrate Systems with Residual Stress Based on Pressure Blister Test Technique

Theoretical Study on Synchronous Characterization of Surface and Interfacial Mechanical Properties of Thin-Film/Substrate Systems with Residual Stress Based on Pressure Blister Test Technique

In this study, based on the pressure blister test technique, a theoretical study on the synchronous characterization of surface and interfacial mechanical properties of thin-film/substrate systems with residual stress was presented, where the problem of axisymmetric deformation of a blistering film...

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Bibliographic Details
Main Authors: Zhi-xin Yang, Jun-yi Sun, Ke Li, Yong-sheng Lian, Xiao-ting He, Zhou-lian Zheng
Format: Article
Language:English
Published: MDPI AG 2018-01-01
Series:Polymers
Subjects:
thin-film/substrate system
residual stress
pressure blister test
interfacial adhesion energy
synchronous characterization
Online Access:http://www.mdpi.com/2073-4360/10/1/49

Internet

http://www.mdpi.com/2073-4360/10/1/49

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