Reduction and compensation of the transient beam loading effect in a double rf system of synchrotron light sources
Double rf systems are used to lengthen the beam bunches in synchrotron light sources. In such a system, the performance of the bunch lengthening is limited by the transient beam-loading effect, which is induced by gaps in the fill pattern. To improve its performance, we investigate an application of...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2018-01-01
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| Series: | Physical Review Accelerators and Beams |
| Online Access: | http://doi.org/10.1103/PhysRevAccelBeams.21.012001 |