Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819
The authors wish to make the following corrections to this paper [...]
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-04-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/11/8/3451 |