Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819
The authors wish to make the following corrections to this paper [...]
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doaj-0fb5e788ebb04514a1231793306f7ce92021-04-12T23:02:47ZengMDPI AGApplied Sciences2076-34172021-04-01113451345110.3390/app11083451Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819Qiang Fang0Xavier. Maldague1Computer Vision and Systems Laboratory, Department of Electrical and Computer Engineering, Université Laval, av de la Médecine, Québec, QC 1065, CanadaComputer Vision and Systems Laboratory, Department of Electrical and Computer Engineering, Université Laval, av de la Médecine, Québec, QC 1065, CanadaThe authors wish to make the following corrections to this paper [...]https://www.mdpi.com/2076-3417/11/8/3451n/a |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Qiang Fang Xavier. Maldague |
spellingShingle |
Qiang Fang Xavier. Maldague Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819 Applied Sciences n/a |
author_facet |
Qiang Fang Xavier. Maldague |
author_sort |
Qiang Fang |
title |
Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819 |
title_short |
Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819 |
title_full |
Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819 |
title_fullStr |
Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819 |
title_full_unstemmed |
Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819 |
title_sort |
addendum: fang, q.; maldague, x. a method of defect depth estimation for simulated infrared thermography data with deep learning. <i>appl. sci.</i> 2020, <i>10</i>, 6819 |
publisher |
MDPI AG |
series |
Applied Sciences |
issn |
2076-3417 |
publishDate |
2021-04-01 |
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The authors wish to make the following corrections to this paper [...] |
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https://www.mdpi.com/2076-3417/11/8/3451 |
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