Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819

The authors wish to make the following corrections to this paper [...]

Bibliographic Details
Main Authors: Qiang Fang, Xavier. Maldague
Format: Article
Language:English
Published: MDPI AG 2021-04-01
Series:Applied Sciences
Subjects:
n/a
Online Access:https://www.mdpi.com/2076-3417/11/8/3451
id doaj-0fb5e788ebb04514a1231793306f7ce9
record_format Article
spelling doaj-0fb5e788ebb04514a1231793306f7ce92021-04-12T23:02:47ZengMDPI AGApplied Sciences2076-34172021-04-01113451345110.3390/app11083451Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819Qiang Fang0Xavier. Maldague1Computer Vision and Systems Laboratory, Department of Electrical and Computer Engineering, Université Laval, av de la Médecine, Québec, QC 1065, CanadaComputer Vision and Systems Laboratory, Department of Electrical and Computer Engineering, Université Laval, av de la Médecine, Québec, QC 1065, CanadaThe authors wish to make the following corrections to this paper [...]https://www.mdpi.com/2076-3417/11/8/3451n/a
collection DOAJ
language English
format Article
sources DOAJ
author Qiang Fang
Xavier. Maldague
spellingShingle Qiang Fang
Xavier. Maldague
Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819
Applied Sciences
n/a
author_facet Qiang Fang
Xavier. Maldague
author_sort Qiang Fang
title Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819
title_short Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819
title_full Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819
title_fullStr Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819
title_full_unstemmed Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. <i>Appl. Sci.</i> 2020, <i>10</i>, 6819
title_sort addendum: fang, q.; maldague, x. a method of defect depth estimation for simulated infrared thermography data with deep learning. <i>appl. sci.</i> 2020, <i>10</i>, 6819
publisher MDPI AG
series Applied Sciences
issn 2076-3417
publishDate 2021-04-01
description The authors wish to make the following corrections to this paper [...]
topic n/a
url https://www.mdpi.com/2076-3417/11/8/3451
work_keys_str_mv AT qiangfang addendumfangqmaldaguexamethodofdefectdepthestimationforsimulatedinfraredthermographydatawithdeeplearningiapplscii2020i10i6819
AT xaviermaldague addendumfangqmaldaguexamethodofdefectdepthestimationforsimulatedinfraredthermographydatawithdeeplearningiapplscii2020i10i6819
_version_ 1721529481798090752