Influence of Rapid Thermal Annealing on the Characteristics of InGaN/GaN MQWs

N-type InGaN/GaN multiple-quantum-wells (MQWs) were grown on sapphire substrates by metal organic chemical vapor deposition (MOCVD). The crystal quality and optical properties of samples after rapid thermal annealing (RTA) at different temperatures in a range from 400 to 800°C are investigated by X-...

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Bibliographic Details
Main Authors: Tian Yuan, Liang Limin, Xie Xinjian, Liu Hui, Hao Qiuyan, Liu Caichi
Format: Article
Language:English
Published: EDP Sciences 2016-01-01
Series:MATEC Web of Conferences
Subjects:
RTA
XRD
Online Access:http://dx.doi.org/10.1051/matecconf/20166706046