Reliable and Damage-Free Estimation of Resistivity of ZnO Thin Films for Photovoltaic Applications Using Photoluminescence Technique

Reliable and Damage-Free Estimation of Resistivity of ZnO Thin Films for Photovoltaic Applications Using Photoluminescence Technique

This work projects photoluminescence (PL) as an alternative technique to estimate the order of resistivity of zinc oxide (ZnO) thin films. ZnO thin films, deposited using chemical spray pyrolysis (CSP) by varying the deposition parameters like solvent, spray rate, pH of precursor, and so forth, have...

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Bibliographic Details
Main Authors: N. Poornima, T. V. Vimalkumar, V. G. Rajeshmon, C. Sudha Kartha, K. P. Vijayakumar
Format: Article
Language:English
Published: Hindawi Limited 2013-01-01
Series:International Journal of Photoenergy
Online Access:http://dx.doi.org/10.1155/2013/105796

Internet

http://dx.doi.org/10.1155/2013/105796

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