A Novel Top-Down Fabrication Process for Vertically-Stacked Silicon-Nanowire Array

Silicon nanowires are widely used for sensing applications due to their outstanding mechanical, electrical, and optical properties. However, one of the major challenges involves introducing silicon-nanowire arrays to a specific layout location with reproducible and controllable dimensions. Indeed, f...

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Bibliographic Details
Main Authors: Kangil Kim, Jae Keun Lee, Seung Ju Han, Sangmin Lee
Format: Article
Language:English
Published: MDPI AG 2020-02-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/10/3/1146