Determining the Preferred Orientation of Silver-Plating via X-ray Diffraction Profile

Determining the Preferred Orientation of Silver-Plating via X-ray Diffraction Profile

Determining the preferred orientation of plating film is of practical importance. In this work, the Rietveld method and quantitative texture analysis (RM+QTA) are used to analyze the preferred orientation of plating silver film with XRD profile, whose <311> axial texture can be completely desc...

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Bibliographic Details
Main Authors: Taotao Li, Liuwei Zheng, Wanggang Zhang, Pengfei Zhu
Format: Article
Language:English
Published: MDPI AG 2021-09-01
Series:Nanomaterials
Subjects:
preferred orientation
silver plating
Rietveld
quantitative texture analysis
exponential harmonic
crystallite shape
Online Access:https://www.mdpi.com/2079-4991/11/9/2417

Internet

https://www.mdpi.com/2079-4991/11/9/2417

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