Two-Mode Waveguide Characterization by Intensity Measurements from Exit Face Images
A method that characterizes two-mode waveguides whose modes cannot be selectively excited (such as buried waveguides) is presented and demonstrated. The theoretical results are presented for <i>N</i> modes, although for the sake of simplicity, only the two-mode case is developed. The val...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2012-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/6095574/ |