Nano-regime Length Scales Extracted from the First Sharp Diffraction Peak in Non-crystalline SiO<sub>2</sub> and Related Materials: Device Applications

Nano-regime Length Scales Extracted from the First Sharp Diffraction Peak in Non-crystalline SiO<sub>2</sub> and Related Materials: Device Applications

<p>Abstract</p> <p>This paper distinguishes between two different scales of medium range order, MRO, in non-crystalline SiO<sub>2</sub>: (1) the first is ~0.4 to 0.5 nm and is obtained from the position of the first sharp diffraction peak, FSDP, in the X-ray diffraction...

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Bibliographic Details
Main Authors: Phillips James, Lucovsky Gerald
Format: Article
Language:English
Published: SpringerOpen 2010-01-01
Series:Nanoscale Research Letters
Subjects:
Non-crystalline materials
Nano-crystalline thin films
Nano-crystalline/non-crystalline composites
Chemical bonding self-organizations
Percolation theory
Online Access:http://dx.doi.org/10.1007/s11671-009-9520-6

Internet

http://dx.doi.org/10.1007/s11671-009-9520-6

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