The Convolutional Multiple Whole Profile (CMWP) Fitting Method, a Global Optimization Procedure for Microstructure Determination

The analysis of line broadening in X-ray and neutron diffraction patterns using profile functions constructed on the basis of well-established physical principles and TEM observations of lattice defects has proven to be a powerful tool for characterizing microstructures in crystalline materials. The...

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Bibliographic Details
Main Authors: Gábor Ribárik, Bertalan Jóni, Tamás Ungár
Format: Article
Published: MDPI AG 2020-07-01
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