Precision Permittivity Measurement for Low-Loss Thin Planar Materials Using Large Coaxial Probe from 1 to 400 MHz

Precision Permittivity Measurement for Low-Loss Thin Planar Materials Using Large Coaxial Probe from 1 to 400 MHz

This paper focuses on the non-destructive dielectric measurement for low-loss planar materials with a thickness of less than 3 mm using a large coaxial probe with an outer diameter of 48 mm. The aperture probe calibration procedure required only to make a measurement of the half-space air and three...

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Bibliographic Details
Main Authors: Kok Yeow You, Man Seng Sim
Format: Article
Language:English
Published: MDPI AG 2018-12-01
Series:Journal of Manufacturing and Materials Processing
Subjects:
large coaxial probe
thin planar materials
low-loss materials
relative permittivity
reflection coefficient
calibration
Online Access:https://www.mdpi.com/2504-4494/2/4/81

Internet

https://www.mdpi.com/2504-4494/2/4/81

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