Precision Permittivity Measurement for Low-Loss Thin Planar Materials Using Large Coaxial Probe from 1 to 400 MHz
This paper focuses on the non-destructive dielectric measurement for low-loss planar materials with a thickness of less than 3 mm using a large coaxial probe with an outer diameter of 48 mm. The aperture probe calibration procedure required only to make a measurement of the half-space air and three...
Main Authors: | Kok Yeow You, Man Seng Sim |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2018-12-01
|
Series: | Journal of Manufacturing and Materials Processing |
Subjects: | |
Online Access: | https://www.mdpi.com/2504-4494/2/4/81 |
Similar Items
-
Broadband Measurement of Complex Permittivity Using Reflection Method and Coaxial Probes
by: R. Zajicek, et al.
Published: (2008-04-01) -
Combined Thickness and Permittivity Measurement of Thin Layers with Open-Ended Coaxial Probes
by: Kjetil Folgerø, et al.
Published: (2019-04-01) -
Precision permittivity measurement for low-loss thin planar materials using large coaxial probe from 1 to 400 MHz
by: You, Kok Yeow, et al.
Published: (2018) -
Open-Ended Coaxial Probe Measurements of Complex Dielectric Permittivity in Diesel-Contaminated Soil during Bioremediation
by: Andrea Vergnano, et al.
Published: (2020-11-01) -
Comparison of Metal-Backed Free-Space and Open-Ended Coaxial Probe Techniques for the Dielectric Characterization of Aeronautical Composites
by: Patricia López-Rodríguez, et al.
Published: (2016-06-01)