Interconnections between Electronic Structure and Optical Properties of Multilayer Nanolaminate TiAlN/Ag and Al2O3/Ag Coatings

Interconnections between Electronic Structure and Optical Properties of Multilayer Nanolaminate TiAlN/Ag and Al2O3/Ag Coatings

Multilayer nanolaminate TiAlN/Ag and Al2O3/Ag metal-insulator-metal (MIM) coatings with thicknesses of individual layers from a few to several hundreds of nanometers were fabricated by direct current magnetron sputtering. Their optical transmittance and reflectance spectra were measured for photon e...

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Bibliographic Details
Main Authors: Dmitry Wainstein, Anatoly Kovalev, Vladimir Vakhrushev, Raul Gago, Jose L. Endrino
Format: Article
Language:English
Published: MDPI AG 2018-08-01
Series:Coatings
Subjects:
multilayer MIM coatings
TiAlN/Ag
Al2O3/Ag
reflectance
transmittance
electron spectroscopy
Auger electrons spectroscopy (AES)
scanning plasmon microscopy
high-resolution electron energy losses spectroscopy (HREELS)
Online Access:http://www.mdpi.com/2079-6412/8/8/290

Internet

http://www.mdpi.com/2079-6412/8/8/290

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