1T1R Nonvolatile Memory with Al/TiO2/Au and Sol-Gel-Processed Insulator for Barium Zirconate Nickelate Gate in Pentacene Thin Film Transistor

A one-transistor and one-resistor (1T1R) architecture with a resistive random access memory (RRAM) cell connected to an organic thin-film transistor (OTFT) device is successfully demonstrated to avoid the cross-talk issues of only one RRAM cell. The OTFT device, which uses barium zirconate nickelate...

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Bibliographic Details
Main Authors: Ke-Jing Lee, Yu-Chi Chang, Cheng-Jung Lee, Li-Wen Wang, Yeong-Her Wang
Format: Article
Language:English
Published: MDPI AG 2017-12-01
Series:Materials
Subjects:
Online Access:https://www.mdpi.com/1996-1944/10/12/1408