Influence of Lateral Movement on Level Behavior of Adhesion Force Measured Repeatedly by an Atomic Force Microscope (AFM) Colloid Probe in Dry Conditions
An atomic force microscope (AFM) was operated to repeatedly measure the adhesion forces between a polystyrene colloid probe and a gold film, with and without lateral movement in dry conditions. Experimental results show that the adhesion force shows a level behavior without lateral movement and with...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-01-01
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| Series: | Materials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1996-1944/14/2/370 |