Influence of Lateral Movement on Level Behavior of Adhesion Force Measured Repeatedly by an Atomic Force Microscope (AFM) Colloid Probe in Dry Conditions

• Main Authors: Ping Li, Tianmao Lai
• Format: Article
• Language: English
• Published: MDPI AG 2021-01-01
• Series: Materials
• Subjects: pull-off force; force-displacement curve; sliding velocity; level behavior; atomic force microscope
• Online Access: https://www.mdpi.com/1996-1944/14/2/370

An atomic force microscope (AFM) was operated to repeatedly measure the adhesion forces between a polystyrene colloid probe and a gold film, with and without lateral movement in dry conditions. Experimental results show that the adhesion force shows a level behavior without lateral movement and with a small scan distance: the data points are grouped into several levels, and the adhesion force jumps between different levels frequently. This was attributed to the fact that when the cantilever pulls off the sample, the contact area of the sample is not exactly the same between successive contacts and jumps randomly from one to another. Both lateral velocity and material wear have little influence on level behavior. However, with a medium scan distance, level behavior is observed only for some measurements, and adhesion forces are randomly distributed for the other measurements. With a large scan distance, adhesion forces are randomly distributed for all measurements. This was attributed to the fact that the cantilever pulls off the sample in many different contact areas on the scanning path for large distances. These results may help understand the influence of lateral movement and imply the contribution of asperities to adhesion force.