Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling
Evolution of depth profiles of the refractive index in Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub> (YAG) crystals were studied under 200 MeV <sup>136</sup>Xe<sup>14+</sup> ion irradiation, since the index can be related with the stress change...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2020-11-01
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Series: | Quantum Beam Science |
Subjects: | |
Online Access: | https://www.mdpi.com/2412-382X/4/4/39 |