Irradiation Effects of Swift Heavy Ions Detected by Refractive Index Depth Profiling

Evolution of depth profiles of the refractive index in Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub> (YAG) crystals were studied under 200 MeV <sup>136</sup>Xe<sup>14+</sup> ion irradiation, since the index can be related with the stress change...

Full description

Bibliographic Details
Main Authors: Hiroshi Amekura, Rang Li, Nariaki Okubo, Norito Ishikawa, Feng Chen
Format: Article
Language:English
Published: MDPI AG 2020-11-01
Series:Quantum Beam Science
Subjects:
Online Access:https://www.mdpi.com/2412-382X/4/4/39