X-ray Laue Microdiffraction and Raman Spectroscopic Investigation of Natural Silicon and Moissanite

X-ray Laue Microdiffraction and Raman Spectroscopic Investigation of Natural Silicon and Moissanite

Moissanite, SiC, is an uncommon accessory mineral that forms under low oxygen fugacity. Here, we analyze natural SiC from a Miocene tuff-sandstone using synchrotron Laue microdiffraction and Raman spectroscopy, in order to better understand the SiC phases and formation physics. The studied crystals...

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Bibliographic Details
Main Authors: Camelia Veronica Stan, Earl Francis O’Bannon, Pavel Mukhin, Nobumichi Tamura, Larissa Dobrzhinetskaya
Format: Article
Language:English
Published: MDPI AG 2020-02-01
Series:Minerals
Subjects:
sic
laue diffraction
microdiffraction
natural silicon
moissanite
si
synchrotron
polymorph
mineral deformation
Online Access:https://www.mdpi.com/2075-163X/10/3/204

Internet

https://www.mdpi.com/2075-163X/10/3/204

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