Lift-off Effect for Capacitive Imaging Sensors
Capacitive Imaging (CI) sensors are capable of non-destructively detecting both surface and hidden defects in dielectric materials and characterizing conducting surfaces through a relatively thick insulation layer. However, the complex Measurement Sensitivity Distribution (MSD) of CI sensors render...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2018-12-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/18/12/4286 |