A Comparative Study of Silicon Carbide Merged PiN Schottky Diodes with Electrical-Thermal Coupled Considerations

A Comparative Study of Silicon Carbide Merged PiN Schottky Diodes with Electrical-Thermal Coupled Considerations

A comparative study of surge current reliability of 1200V/5A 4H-SiC (silicon carbide) MPS (Merged PiN Schottky) diodes with different technologies is presented. The influences of device designs in terms of electrical and thermal aspects on the forward conduction performance and surge current capabil...

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Bibliographic Details
Main Authors: Jiupeng Wu, Na Ren, Qing Guo, Kuang Sheng
Format: Article
Language:English
Published: MDPI AG 2020-06-01
Series:Materials
Subjects:
SiC
MPS diode
junction temperature
surge current
thermal resistance
Online Access:https://www.mdpi.com/1996-1944/13/11/2669

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https://www.mdpi.com/1996-1944/13/11/2669

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