Ablation in Externally Applied Electric and Magnetic Fields

Ablation in Externally Applied Electric and Magnetic Fields

To harness light-matter interactions at the nano-/micro-scale, better tools for control must be developed. Here, it is shown that by applying an external electric and/or magnetic field, ablation of Si and glass under ultra-short (sub-1 ps) laser pulse irradiation can be controlled via the Lorentz fo...

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Bibliographic Details
Main Authors: Jovan Maksimovic, Soon-Hock Ng, Tomas Katkus, Nguyen Hoai An Le, James W.M. Chon, Bruce C.C. Cowie, Tao Yang, Yves Bellouard, Saulius Juodkazis
Format: Article
Language:English
Published: MDPI AG 2020-01-01
Series:Nanomaterials
Subjects:
ablation
electric field
magnetic field
debris
femtosecond laser fabrication
silicon
near-edge x-ray absorption fine structure (nexafs)
Online Access:https://www.mdpi.com/2079-4991/10/2/182

Internet

https://www.mdpi.com/2079-4991/10/2/182

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