SVD-Based Evaluation of Multiplexing in Multipinhole SPECT Systems
Multipinhole SPECT system design is largely a trial-and-error process. General principles can give system designers a general idea of how a system with certain characteristics will perform. However, the specific performance of any particular system is unknown before the system is tested. The develop...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2008-01-01
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| Series: | International Journal of Biomedical Imaging |
| Online Access: | http://dx.doi.org/10.1155/2008/769195 |