Quantitative Characterization of Reconfigurable Transistor Logic Gates
We present a new approach for early analysis of logic gates that is based on formal methods. As device technology research takes years and is very expensive, it is desirable to evaluate a technology's potential as early as possible, which is hard to do with current techniques. The actual impact...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9113477/ |