Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy

Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy

We present a detailed study of compressively strained PbxSr1−xTiO3 thin films grown by off-axis radio frequency magnetron sputtering on (001)-oriented Nb-doped SrTiO3 substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thic...

Full description

Bibliographic Details
Main Authors: S. Fernandez-Peña, C. Lichtensteiger, P. Zubko, C. Weymann, S. Gariglio, J.-M. Triscone
Format: Article
Language:English
Published: AIP Publishing LLC 2016-08-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/1.4960621

Internet

http://dx.doi.org/10.1063/1.4960621

Similar Items