Enhanced FIB-SEM systems for large-volume 3D imaging

Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) can automatically generate 3D images with superior z-axis resolution, yielding data that needs minimal image registration and related post-processing. Obstacles blocking wider adoption of FIB-SEM include slow imaging speed and lack of long-term...

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Bibliographic Details
Main Authors: C Shan Xu, Kenneth J Hayworth, Zhiyuan Lu, Patricia Grob, Ahmed M Hassan, José G García-Cerdán, Krishna K Niyogi, Eva Nogales, Richard J Weinberg, Harald F Hess
Format: Article
Language:English
Published: eLife Sciences Publications Ltd 2017-05-01
Series:eLife
Subjects:
FIB
Online Access:https://elifesciences.org/articles/25916