Using Noise and Fluctuations for In Situ  Measurements of Nitrogen Diffusion Depth

Using Noise and Fluctuations for In Situ  Measurements of Nitrogen Diffusion Depth

In manufacturing processes involving diffusion (of C, N, S, etc.), the evolution of the layer depth is of the utmost importance: the success of the entire process depends on this parameter. Currently, nitriding is typically either calibrated using a “post process” method or controlled via indirect...

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Bibliographic Details
Main Authors: Cornel Samoila, Doru Ursutiu, Walter‐Harald Schleer, Vlad Jinga, Victor Nascov
Format: Article
Language:English
Published: MDPI AG 2016-10-01
Series:Materials
Subjects:
diffusion
 furnace
 magnetic
 manufacturing
 nitriding
 sensors
 temperature
 thermochemistry
Online Access:http://www.mdpi.com/1996-1944/9/10/819

Internet

http://www.mdpi.com/1996-1944/9/10/819

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