Characterization of silicon heterojunctions for solar cells

<p>Abstract</p> <p>Conductive-probe atomic force microscopy (CP-AFM) measurements reveal the existence of a conductive channel at the interface between <it>p</it>-type hydrogenated amorphous silicon (<it>a</it>-Si:H) and <it>n</it>-type crystalli...

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Bibliographic Details
Main Authors: Ankudinov Alexander, Gushchina Ekaterina, Terukov Eugene, Labrune Martin, Roca i Cabarrocas Pere, Gudovskikh Alexander, Kleider Jean-Paul, Alvarez Jose, Maslova Olga, Favre Wilfried, Gueunier-Farret Marie-Estelle
Format: Article
Language:English
Published: SpringerOpen 2011-01-01
Series:Nanoscale Research Letters
Online Access:http://www.nanoscalereslett.com/content/6/1/152