Characterization of silicon heterojunctions for solar cells
<p>Abstract</p> <p>Conductive-probe atomic force microscopy (CP-AFM) measurements reveal the existence of a conductive channel at the interface between <it>p</it>-type hydrogenated amorphous silicon (<it>a</it>-Si:H) and <it>n</it>-type crystalli...
Main Authors: | , , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
SpringerOpen
2011-01-01
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Series: | Nanoscale Research Letters |
Online Access: | http://www.nanoscalereslett.com/content/6/1/152 |