In-situ SEM and optical microscopy testing for investigation of fatigue crack growth mechanism under overload

In this paper, the in-situ scanning electron microscope (SEM) and optical microscopy experiments are performed to investigate the crack growth behavior under the single tensile overload. The objectives are to (i) examine the overload-induced crack growth micromechanisms, including the initial crack...

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Bibliographic Details
Main Authors: Zhang Wei, Cai Liang
Format: Article
Language:English
Published: EDP Sciences 2018-01-01
Series:MATEC Web of Conferences
Online Access:https://doi.org/10.1051/matecconf/201816513013