In-situ SEM and optical microscopy testing for investigation of fatigue crack growth mechanism under overload
In this paper, the in-situ scanning electron microscope (SEM) and optical microscopy experiments are performed to investigate the crack growth behavior under the single tensile overload. The objectives are to (i) examine the overload-induced crack growth micromechanisms, including the initial crack...
Main Authors: | Zhang Wei, Cai Liang |
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Format: | Article |
Language: | English |
Published: |
EDP Sciences
2018-01-01
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Series: | MATEC Web of Conferences |
Online Access: | https://doi.org/10.1051/matecconf/201816513013 |
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