High Density Multi-Channel Passively Aligned Optical Probe for Testing of Photonic Integrated Circuits

In this work we report the results of high density multi-channel optical multiprobes with pitches of 25 μm and 50 μm that provide edge-coupling used for on-wafer parallel testing of photonic integrated circuits. The probes are fabricated in an oxynitride platform and test demon...

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Bibliographic Details
Main Authors: Xaveer Leijtens, Rui Santos, Kevin Williams
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9296295/