Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements
X-ray free electron lasers (XFELs) providing ultrashort intense pulses of X-rays have proven to be excellent tools to investigate the dynamics of radiation-induced dissociation and charge redistribution in molecules and nanoparticles. Coincidence techniques, in particular multi-ion time-of-flight (T...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2017-05-01
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Series: | Applied Sciences |
Subjects: | |
Online Access: | http://www.mdpi.com/2076-3417/7/5/531 |