Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements

Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements

X-ray free electron lasers (XFELs) providing ultrashort intense pulses of X-rays have proven to be excellent tools to investigate the dynamics of radiation-induced dissociation and charge redistribution in molecules and nanoparticles. Coincidence techniques, in particular multi-ion time-of-flight (T...

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Bibliographic Details
Main Authors: Edwin Kukk, Koji Motomura, Hironobu Fukuzawa, Kiyonobu Nagaya, Kiyoshi Ueda
Format: Article
Language:English
Published: MDPI AG 2017-05-01
Series:Applied Sciences
Subjects:
free electron laser
Coulomb explosion
radiation damage
molecular dynamics
X-ray absorption
ultrafast dissociation
coincidence
photoion-photoion coincidence (PIPICO)
ion mass spectroscopy
time-of-flight
Online Access:http://www.mdpi.com/2076-3417/7/5/531

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http://www.mdpi.com/2076-3417/7/5/531

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