A New Approach to the Habit Determination of Nano-objects by SEM

A New Approach to the Habit Determination of Nano-objects by SEM

A novel approach to the inspection of nanoparticle habit was proposed in our previous papers. This approach is based on a joint analysis of two scanning electron microscopy (SEM) images corresponding to different convergences of illuminating electron beams. However, increasing convergence worsens an...

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Bibliographic Details
Main Authors: K. S. Maksimov, S. K. Maksimov
Format: Article
Language:English
Published: SAGE Publishing 2013-06-01
Series:Nanomaterials and Nanotechnology
Subjects:
Nano‐Object Size
Nano‐Object Shape
Scanning Electron Microscopy
Convergent Illuminating Electron Beams
Defocused Images
Online Access:http://www.intechopen.com/journals/nanomaterials_and_nanotechnology/a-new-approach-to-the-habit-determination-of-nano-objects-by-sem

Internet

http://www.intechopen.com/journals/nanomaterials_and_nanotechnology/a-new-approach-to-the-habit-determination-of-nano-objects-by-sem

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