A New Approach to the Habit Determination of Nano-objects by SEM
A novel approach to the inspection of nanoparticle habit was proposed in our previous papers. This approach is based on a joint analysis of two scanning electron microscopy (SEM) images corresponding to different convergences of illuminating electron beams. However, increasing convergence worsens an...
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doaj-1edf7389512c4e0cbb7a57aa7047a02f2020-11-25T03:19:58ZengSAGE PublishingNanomaterials and Nanotechnology1847-98042013-06-013 6 http://dx.doi.org/10.5772/5674645273A New Approach to the Habit Determination of Nano-objects by SEMK. S. MaksimovS. K. MaksimovA novel approach to the inspection of nanoparticle habit was proposed in our previous papers. This approach is based on a joint analysis of two scanning electron microscopy (SEM) images corresponding to different convergences of illuminating electron beams. However, increasing convergence worsens an image as the result of spherical aberration. Therefore, for the first time in this paper we describe in detail a new approach which is an alternative to the method of two convergences. It is based on the use of two defocusings which are identical in size, but opposite in signs, thereby. simplifying the demands of SEM.http://www.intechopen.com/journals/nanomaterials_and_nanotechnology/a-new-approach-to-the-habit-determination-of-nano-objects-by-semNano‐Object SizeNano‐Object ShapeScanning Electron MicroscopyConvergent Illuminating Electron BeamsDefocused Images |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
K. S. Maksimov S. K. Maksimov |
spellingShingle |
K. S. Maksimov S. K. Maksimov A New Approach to the Habit Determination of Nano-objects by SEM Nanomaterials and Nanotechnology Nano‐Object Size Nano‐Object Shape Scanning Electron Microscopy Convergent Illuminating Electron Beams Defocused Images |
author_facet |
K. S. Maksimov S. K. Maksimov |
author_sort |
K. S. Maksimov |
title |
A New Approach to the Habit Determination of Nano-objects by SEM |
title_short |
A New Approach to the Habit Determination of Nano-objects by SEM |
title_full |
A New Approach to the Habit Determination of Nano-objects by SEM |
title_fullStr |
A New Approach to the Habit Determination of Nano-objects by SEM |
title_full_unstemmed |
A New Approach to the Habit Determination of Nano-objects by SEM |
title_sort |
new approach to the habit determination of nano-objects by sem |
publisher |
SAGE Publishing |
series |
Nanomaterials and Nanotechnology |
issn |
1847-9804 |
publishDate |
2013-06-01 |
description |
A novel approach to the inspection of
nanoparticle habit was proposed in our previous papers.
This approach is based on a joint analysis of two scanning
electron microscopy (SEM) images corresponding to
different convergences of illuminating electron beams.
However, increasing convergence worsens an image as
the result of spherical aberration. Therefore, for the first
time in this paper we describe in detail a new approach
which is an alternative to the method of two
convergences. It is based on the use of two defocusings
which are identical in size, but opposite in signs, thereby.
simplifying the demands of SEM. |
topic |
Nano‐Object Size Nano‐Object Shape Scanning Electron Microscopy Convergent Illuminating Electron Beams Defocused Images |
url |
http://www.intechopen.com/journals/nanomaterials_and_nanotechnology/a-new-approach-to-the-habit-determination-of-nano-objects-by-sem |
work_keys_str_mv |
AT ksmaksimov anewapproachtothehabitdeterminationofnanoobjectsbysem AT skmaksimov anewapproachtothehabitdeterminationofnanoobjectsbysem AT ksmaksimov newapproachtothehabitdeterminationofnanoobjectsbysem AT skmaksimov newapproachtothehabitdeterminationofnanoobjectsbysem |
_version_ |
1724620042794958848 |