Elemental intermixing within an ultrathin SrRuO3 electrode layer in epitaxial heterostructure BaTiO3/SrRuO3/SrTiO3

Elemental intermixing within an ultrathin SrRuO3 electrode layer in epitaxial heterostructure BaTiO3/SrRuO3/SrTiO3

Aberration corrected scanning transmission electron microscopy is used to directly observe atom columns in an epitaxial BaTiO3 thin film deposited on a 3.6 nm-thick SrRuO3 electrode layer above an SrTiO3 (001) substrate. Compositional gradients across the heterointerfaces were examined using electro...

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Bibliographic Details
Main Authors: H. B. Zhang, R. J. Qi, N. F. Ding, R. Huang, L. Sun, C. G. Duan, Craig A. J. Fisher, J. H. Chu, Y. Ikuhara
Format: Article
Language:English
Published: AIP Publishing LLC 2016-01-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4940663

Internet

http://dx.doi.org/10.1063/1.4940663

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