Dimension Scaling Effects on Conduction and Low Frequency Noise Characteristics of ITO-Stabilized ZnO Thin Film Transistors

Dimension Scaling Effects on Conduction and Low Frequency Noise Characteristics of ITO-Stabilized ZnO Thin Film Transistors

Conduction characteristics and low frequency noises in ITO-stabilized ZnO thin film transistors (TFTs) with constant channel width (W=50 μm) and different channel lengths (L=5, 10, 25, 50 and 100 μm) are measured and analysis. Firstly, dependences of threshold voltage and field...

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Bibliographic Details
Main Authors: Yuan Liu, Yu-Xuan Huang, Sunbin Deng, Man Wong, Hoi-Sing Kwok, Rongsheng Chen
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
ITO-stabilized ZnO
thin film transistor
low frequency noise
channel length
threshold voltage
field effect mobility
Online Access:https://ieeexplore.ieee.org/document/9060960/

Internet

https://ieeexplore.ieee.org/document/9060960/

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