Hardened Flip-Flop Optimized for Subthreshold Operation Heavy Ion Characterization of a Radiation
A novel Single Event Upset (SEU) tolerant flip-flop design is proposed, which is well suited for very-low power electronics that operate in subthreshold ( < <em>Vt</em> ≈ 500 mV). The proposed flip-flop along with a traditional (unprotected) flip-flop, a Sense-Ampl...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2012-05-01
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| Series: | Journal of Low Power Electronics and Applications |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2079-9268/2/2/168 |