PREDIKSI MASA KEDALUWARSA WAFER DENGAN ARTIFICIAL NEURAL NETWORK (ANN) BERDASARKAN PARAMETER NILAI KAPASITANSI (Prediction of Wafer Shelf Life Using Artificial Neural Network Based on Capacitance Parameter)

PREDIKSI MASA KEDALUWARSA WAFER DENGAN ARTIFICIAL NEURAL NETWORK (ANN) BERDASARKAN PARAMETER NILAI KAPASITANSI (Prediction of Wafer Shelf Life Using Artificial Neural Network Based on Capacitance Parameter)

Wafer is type of biscuit frequently found on expired condition in market, therefore prediction method should be implemented to avoid this condition. apart from the prediction of shelf-life of wafer done by laboratory test, which were time-consuming, expensive, required trained panelists, complex equ...

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Bibliographic Details
Main Authors: Erna Rusliana Muhamad Saleh, Erliza Noor, Taufik Djatna, Irzaman Irzaman
Format: Article
Language:English
Published: Universitas Gadjah Mada 2014-02-01
Series:Agritech
Online Access:https://jurnal.ugm.ac.id/agritech/article/view/9541

Internet

https://jurnal.ugm.ac.id/agritech/article/view/9541

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