Prestress-loading effect on the current–voltage characteristics of a piezoelectric p–n junction together with the corresponding mechanical tuning laws

A model is proposed to study the diffusion of non-equilibrium minority carriers under the influence of a piezo potential and to calculate the corresponding current–voltage (I–V) characteristics of a piezoelectric p–n junction exposed to mechanical loading. An effective solution to describe this non-...

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Bibliographic Details
Main Authors: Wanli Yang, Shuaiqi Fan, Yuxing Liang, Yuantai Hu
Format: Article
Language:English
Published: Beilstein-Institut 2019-09-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.10.178