Probabilistic model for the simulation of secondary electron emission
We provide a detailed description of a model and its computational algorithm for the secondary electron emission process. The model is based on a broad phenomenological fit to data for the secondary-emission yield and the emitted-energy spectrum. We provide two sets of values for the parameters by f...
Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
American Physical Society
2002-12-01
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Series: | Physical Review Special Topics. Accelerators and Beams |
Online Access: | http://doi.org/10.1103/PhysRevSTAB.5.124404 |