Probabilistic model for the simulation of secondary electron emission

We provide a detailed description of a model and its computational algorithm for the secondary electron emission process. The model is based on a broad phenomenological fit to data for the secondary-emission yield and the emitted-energy spectrum. We provide two sets of values for the parameters by f...

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Bibliographic Details
Main Authors: M. A. Furman, M. T. F. Pivi
Format: Article
Language:English
Published: American Physical Society 2002-12-01
Series:Physical Review Special Topics. Accelerators and Beams
Online Access:http://doi.org/10.1103/PhysRevSTAB.5.124404