Observation of anomalous emissions of nonpolar a-plane MgZnO and ZnO epi-films based on XEOL and time-resolved XEOL in hybrid bunch mode
X-ray excited optical luminescence (XEOL) using an x-ray nanobeam operating in the hybrid bunch mode provides not only a sufficiently high peak power density but also high-quality temporal domain measurements for studying the luminescence dynamics of photonic materials and devices. We used these fea...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2020-08-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0015244 |