Innovative Transient Study of Tri-Bandpass Negative Group Delay Applied to Microstrip Barcode-Circuit

Innovative Transient Study of Tri-Bandpass Negative Group Delay Applied to Microstrip Barcode-Circuit

A transient study of bandpass (BP) negative group delay (NGD) function is devoted in this paper. The transient analysis is applied to an original topology of NGD barcode-shape microstrip circuit. The performed investigation explains how to realize the transient analysis of tri-band NGD circuit. The...

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Bibliographic Details
Main Authors: Lili Wu, Fayu Wan, Rym Assila Belhadj Mefteh, Remy Vauche, George Chan, Xiang Zhou, Fayrouz Haddad, Wenceslas Rahajandraibe, Blaise Ravelo
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Coupled lines (CLs)
distributed circuit
modelling method
barcode topology
bandpass (BP) negative group delay (NGD)
microwave circuit
Online Access:https://ieeexplore.ieee.org/document/9514541/

Internet

https://ieeexplore.ieee.org/document/9514541/

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