Artifacts in time-resolved Kelvin probe force microscopy

Kelvin probe force microscopy (KPFM) has been used for the characterization of metals, insulators, and semiconducting materials on the nanometer scale. Especially in semiconductors, the charge dynamics are of high interest. Recently, several techniques for time-resolved measurements with time resolu...

Full description

Bibliographic Details
Main Authors: Sascha Sadewasser, Nicoleta Nicoara, Santiago D. Solares
Format: Article
Language:English
Published: Beilstein-Institut 2018-04-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.9.119