Bayesian Monitoring of Linear Profiles Using DEWMA Control Structures With Random <inline-formula> <tex-math notation="LaTeX">$X$ </tex-math></inline-formula>
The process structures of manufacturing industry are efficiently modeled using linear profiles. Classical and Bayesian set-ups are two well-appreciated schemes for designing control charts for the monitoring of process structures. Mostly in profiles monitoring the independent variables along with th...
Main Authors: | , , , |
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Format: | Article |
Language: | English |
Published: |
IEEE
2018-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/8558555/ |