X-Ray Diffractometry of Thin Layers - Possibilities and Problems
Efficieney of two deconvolution methods used in X-ray powder diffraction analysis is compared for thin films of Pd and Pt. The first method is the classical Stokes method and the second one is method of indirect deconvolution. But calculated integral breadth of Gauss and Cauchy components of Voigt f...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
VSB-Technical University of Ostrava
2005-01-01
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| Series: | Advances in Electrical and Electronic Engineering |
| Subjects: | |
| Online Access: | http://advances.utc.sk/index.php/AEEE/article/view/487 |